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High Resolution Particle Size Analysis By providing both centrifugal and gravitational sedimentation in one instrument the BI-XDC brings these well established methods of particle sizing up to date for today’s fine particle technology. With an X-ray technology to give error free measurements, fast and accurate size distributions across the “one-micron” transition region are easily obtained. Now, with a single instrument you can get true high resolution, accurate, particle size distributions from 10 nanometers right up to 100 microns. Brookhaven’s advanced scanning detector technology and wide disc speed range lets you optimize analysis times and broaden the range of samples you can analyze. With the Brookhaven Bl-XDC there are no optical corrections and no optical properties to worry about, just a simple mass sensitive response based on X-ray absorption.
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